巨磁阻(GMR)记录磁头的hda级ESD测试

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Pub Date : 2000-09-26 DOI:10.1109/EOSESD.2000.890047

D. Nordin

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引用次数: 4

摘要

讨论了一种新型台式磁盘驱动器的驱动器级静电放电(ESD)行为。使用ESD枪(IEC-801)模拟30kv以下的ESD事件。驱动器在最终装配水平进行评估。磁头磁盘组件(hda)配备GMR磁头和单端前置放大器。采用类似于头盘组件评估的方式(Wallash, 1999)，在驱动器的不同战略点使用防静电枪对头盘组件进行了应力测试。印刷电路板在将ESD事件引导到底座时到位，并移除以解决电机引脚的问题。采用准静态测试仪(QST)对GMR头部状态进行了评价，该状态由信号幅度、电阻和钉住层方向描述。QST能够在不拆卸驱动器的情况下评估GMR状况。讨论了ESD应力前后GMR状态的分析。

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HDA-level ESD testing of giant magnetoresistive (GMR) recording heads

The drive-level electrostatic discharge (ESD) behavior of a recent model of a desktop disk drive is discussed. ESD events are simulated up to 30 kV using an ESD gun (IEC-801). The drives were evaluated at the final assembly level. The head disk assemblies (HDAs) were equipped with GMR heads and single ended preamplifiers. In a manner similar to evaluations of head stack assemblies (Wallash, 1999), the head disk assemblies were stressed using an ESD gun at various strategic points of the drive. The printed circuit boards were in place when directing ESD events to the base and removed to address the motor pins. A quasi-static tester (QST) was employed to evaluate the GMR head condition as described by the signal amplitude, resistance and pinned layer orientation. The QST was able to evaluate the GMR condition without any disassembly of the drive. Analyses of the GMR condition before and after ESD stress are discussed.

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Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)

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