复杂工艺优化在单片微波电路设计中的应用

A. Gudkov, V. Leushin, S. Meshkov, V. V. Popov
{"title":"复杂工艺优化在单片微波电路设计中的应用","authors":"A. Gudkov, V. Leushin, S. Meshkov, V. V. Popov","doi":"10.1109/CRMICO.2008.4676491","DOIUrl":null,"url":null,"abstract":"The development problem of methods and features of complex technological optimization is considered, i.e. the interconnected choice of probability of activities of functions by party microwave MMIC per unit time, tolerance of output electrical quantities (function indexes), faultiness probability and guaranteed quality of party and individual samples of microwave MIC is put using existing technologies and without updating their structure and parameters.","PeriodicalId":328074,"journal":{"name":"2008 18th International Crimean Conference - Microwave & Telecommunication Technology","volume":"125 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Application of complex technological optimization for monolithic microwave circuits designing\",\"authors\":\"A. Gudkov, V. Leushin, S. Meshkov, V. V. Popov\",\"doi\":\"10.1109/CRMICO.2008.4676491\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The development problem of methods and features of complex technological optimization is considered, i.e. the interconnected choice of probability of activities of functions by party microwave MMIC per unit time, tolerance of output electrical quantities (function indexes), faultiness probability and guaranteed quality of party and individual samples of microwave MIC is put using existing technologies and without updating their structure and parameters.\",\"PeriodicalId\":328074,\"journal\":{\"name\":\"2008 18th International Crimean Conference - Microwave & Telecommunication Technology\",\"volume\":\"125 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-11-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 18th International Crimean Conference - Microwave & Telecommunication Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CRMICO.2008.4676491\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 18th International Crimean Conference - Microwave & Telecommunication Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CRMICO.2008.4676491","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

考虑了复杂技术优化方法和特点的发展问题,即采用现有技术,在不更新结构和参数的情况下,对单位时间内组方微波MMIC函数活动概率、输出电量公差(功能指标)、组方和单个微波MIC样品的故障概率和保证质量进行互联选择。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Application of complex technological optimization for monolithic microwave circuits designing
The development problem of methods and features of complex technological optimization is considered, i.e. the interconnected choice of probability of activities of functions by party microwave MMIC per unit time, tolerance of output electrical quantities (function indexes), faultiness probability and guaranteed quality of party and individual samples of microwave MIC is put using existing technologies and without updating their structure and parameters.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信