{"title":"复杂工艺优化在单片微波电路设计中的应用","authors":"A. Gudkov, V. Leushin, S. Meshkov, V. V. Popov","doi":"10.1109/CRMICO.2008.4676491","DOIUrl":null,"url":null,"abstract":"The development problem of methods and features of complex technological optimization is considered, i.e. the interconnected choice of probability of activities of functions by party microwave MMIC per unit time, tolerance of output electrical quantities (function indexes), faultiness probability and guaranteed quality of party and individual samples of microwave MIC is put using existing technologies and without updating their structure and parameters.","PeriodicalId":328074,"journal":{"name":"2008 18th International Crimean Conference - Microwave & Telecommunication Technology","volume":"125 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Application of complex technological optimization for monolithic microwave circuits designing\",\"authors\":\"A. Gudkov, V. Leushin, S. Meshkov, V. V. Popov\",\"doi\":\"10.1109/CRMICO.2008.4676491\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The development problem of methods and features of complex technological optimization is considered, i.e. the interconnected choice of probability of activities of functions by party microwave MMIC per unit time, tolerance of output electrical quantities (function indexes), faultiness probability and guaranteed quality of party and individual samples of microwave MIC is put using existing technologies and without updating their structure and parameters.\",\"PeriodicalId\":328074,\"journal\":{\"name\":\"2008 18th International Crimean Conference - Microwave & Telecommunication Technology\",\"volume\":\"125 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-11-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 18th International Crimean Conference - Microwave & Telecommunication Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CRMICO.2008.4676491\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 18th International Crimean Conference - Microwave & Telecommunication Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CRMICO.2008.4676491","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Application of complex technological optimization for monolithic microwave circuits designing
The development problem of methods and features of complex technological optimization is considered, i.e. the interconnected choice of probability of activities of functions by party microwave MMIC per unit time, tolerance of output electrical quantities (function indexes), faultiness probability and guaranteed quality of party and individual samples of microwave MIC is put using existing technologies and without updating their structure and parameters.