{"title":"在多个测试平台上实现IEEE 1641放大器特性","authors":"M. Cornish, Malcolm Brown, J. Ganzert","doi":"10.1109/AUTEST.2009.5314000","DOIUrl":null,"url":null,"abstract":"A fourth in a series of studies, sponsored by the UK MoD, explores gain and 1 dB compression point, for a mobile communications device, through IEEE Std. 1641™ Signal & Test Definition [1]. The study adds depth to the use of load, Power and Physical types, along with methods for capability description of test resources, through IEEE ATML [2]. In addition, comparison is made with previous studies, in particular that into RF stimulus & measurement [5]. The implementation platform consists of Rohde & Schwarz's Vector Signal Generator, Spectrum Analyser & Vector Network Analyser. The tests are defined using the Standard's Test Signal Framework (TSF); use is made of the Standard's Signal Modelling Language to validate the behaviour of the test signals; IEEE ATML Test Station is used to describe the mapping onto the test resources; an XML document is written to describe the mapping to the test resource IVI drivers; and, an IEEE 1641 defined COM interface is used access these documents. By producing a test program that conforms to the IEEE 1641 defined interfaces, it is shown that the defined tests can be validated, translated to the test platform's native IVI and executed, all using the same source.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"278 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Implementing IEEE 1641 - amplifier characterisation on multiple test platforms\",\"authors\":\"M. Cornish, Malcolm Brown, J. Ganzert\",\"doi\":\"10.1109/AUTEST.2009.5314000\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A fourth in a series of studies, sponsored by the UK MoD, explores gain and 1 dB compression point, for a mobile communications device, through IEEE Std. 1641™ Signal & Test Definition [1]. The study adds depth to the use of load, Power and Physical types, along with methods for capability description of test resources, through IEEE ATML [2]. In addition, comparison is made with previous studies, in particular that into RF stimulus & measurement [5]. The implementation platform consists of Rohde & Schwarz's Vector Signal Generator, Spectrum Analyser & Vector Network Analyser. The tests are defined using the Standard's Test Signal Framework (TSF); use is made of the Standard's Signal Modelling Language to validate the behaviour of the test signals; IEEE ATML Test Station is used to describe the mapping onto the test resources; an XML document is written to describe the mapping to the test resource IVI drivers; and, an IEEE 1641 defined COM interface is used access these documents. By producing a test program that conforms to the IEEE 1641 defined interfaces, it is shown that the defined tests can be validated, translated to the test platform's native IVI and executed, all using the same source.\",\"PeriodicalId\":187421,\"journal\":{\"name\":\"2009 IEEE AUTOTESTCON\",\"volume\":\"278 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-11-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2009.5314000\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2009.5314000","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Implementing IEEE 1641 - amplifier characterisation on multiple test platforms
A fourth in a series of studies, sponsored by the UK MoD, explores gain and 1 dB compression point, for a mobile communications device, through IEEE Std. 1641™ Signal & Test Definition [1]. The study adds depth to the use of load, Power and Physical types, along with methods for capability description of test resources, through IEEE ATML [2]. In addition, comparison is made with previous studies, in particular that into RF stimulus & measurement [5]. The implementation platform consists of Rohde & Schwarz's Vector Signal Generator, Spectrum Analyser & Vector Network Analyser. The tests are defined using the Standard's Test Signal Framework (TSF); use is made of the Standard's Signal Modelling Language to validate the behaviour of the test signals; IEEE ATML Test Station is used to describe the mapping onto the test resources; an XML document is written to describe the mapping to the test resource IVI drivers; and, an IEEE 1641 defined COM interface is used access these documents. By producing a test program that conforms to the IEEE 1641 defined interfaces, it is shown that the defined tests can be validated, translated to the test platform's native IVI and executed, all using the same source.