极紫外激光烧蚀质谱法纳米级同位素成像

2019 IEEE Photonics Conference (IPC) Pub Date : 2019-09-01 DOI:10.1109/IPCon.2019.8908402

L. Rush, T. Green, I. Kuznetsov, Dallas D. Reilly, J. Rocca, A. Duffin, C. Menoni

{"title":"极紫外激光烧蚀质谱法纳米级同位素成像","authors":"L. Rush, T. Green, I. Kuznetsov, Dallas D. Reilly, J. Rocca, A. Duffin, C. Menoni","doi":"10.1109/IPCon.2019.8908402","DOIUrl":null,"url":null,"abstract":"We report on the development of an extreme ultraviolet laser ablation time-of-flight mass spectrometer for high resolution elemental and isotopic analysis, and show how it compares to more developed analytical techniques such as secondary ion mass spectrometry.","PeriodicalId":314151,"journal":{"name":"2019 IEEE Photonics Conference (IPC)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Nanoscale Isotopic Imaging by Extreme Ultraviolet Laser Ablation Mass Spectrometry\",\"authors\":\"L. Rush, T. Green, I. Kuznetsov, Dallas D. Reilly, J. Rocca, A. Duffin, C. Menoni\",\"doi\":\"10.1109/IPCon.2019.8908402\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report on the development of an extreme ultraviolet laser ablation time-of-flight mass spectrometer for high resolution elemental and isotopic analysis, and show how it compares to more developed analytical techniques such as secondary ion mass spectrometry.\",\"PeriodicalId\":314151,\"journal\":{\"name\":\"2019 IEEE Photonics Conference (IPC)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE Photonics Conference (IPC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPCon.2019.8908402\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE Photonics Conference (IPC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPCon.2019.8908402","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

我们报告了一种用于高分辨率元素和同位素分析的极紫外激光烧蚀飞行时间质谱仪的发展，并展示了它与二次离子质谱等更发达的分析技术的比较。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Nanoscale Isotopic Imaging by Extreme Ultraviolet Laser Ablation Mass Spectrometry

We report on the development of an extreme ultraviolet laser ablation time-of-flight mass spectrometer for high resolution elemental and isotopic analysis, and show how it compares to more developed analytical techniques such as secondary ion mass spectrometry.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2019 IEEE Photonics Conference (IPC)

自引率

0.00%

发文量