使用微加热器抑制封装内部温度过高的金锡焊接

H. Mizusaki, Toshiro Sato, M. Sonehara
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引用次数: 0

摘要

高熔点焊料,约300°C,通常用于组装回流装置。当使用焊料将热敏器件(如居里温度约为250°C的PZT传感器)封装在封装中时,封装内部的温度必须低于250°C并进行精确测量,以避免热损坏。在这项研究中,作者提出了一种新的基于芯片尺寸温度计的封装内部原位温度测量方法。开发了一种新的焊接方法,使用微加热器局部加热焊料而不会在封装内部过热。在对整个封装进行加热的常规焊接方法中,封装内部温度达到260℃;在新的焊接方法中,温度保持在180°C。此外,通过瞬态传热分析,详细研究了包内温度分布。分析结果与两种焊接方法的实验结果吻合较好。从分析结果来看,封装内部的导电通孔有助于将热量传递给焊料,而Si盖则起到了传热路径的作用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Au–Sn Soldering Using a Micro-heater to Restrain Excess Temperature Rise Inside the Package
The high-melting point solder, approximately 300°C, is often used for assembling reflow-capable devices. When thermally sensitive devices such as PZT sensors with a Curie temperature of approximately 250 °C are encased in a package using solder, the temperature inside the package must be below 250 °C and precisely measured to avoid thermal damage. In this study, the authors proposed a novel in-situ temperature measurement method inside the package based on a chip-sized thermometer. A new soldering method using a micro-heater was developed to heat solder locally without overheating inside the package. In the conventional soldering method of heating the whole package, the temperature inside the package reached 260 °C; in the new soldering method, it was kept to 180 °C. Moreover, the temperature distribution inside the package was examined in detail by transient heat transfer analysis. The analysis results were in agreement with the experimental results using the two soldering methods. From the analysis results, it was found that the electrically conductive vias inside the package assisted in the transfer of heat to the solder and a Si lid played a role as the heat transfer path.
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