基于路由资源图的FPGA互连测试算法

2008 9th International Conference on Solid-State and Integrated-Circuit Technology Pub Date : 2008-12-30 DOI:10.1109/ICSICT.2008.4734988

L. Dai, Zhi-bin Liu, Shao-chi Liang, Meng Yang, Ling-li Wang

{"title":"基于路由资源图的FPGA互连测试算法","authors":"L. Dai, Zhi-bin Liu, Shao-chi Liang, Meng Yang, Ling-li Wang","doi":"10.1109/ICSICT.2008.4734988","DOIUrl":null,"url":null,"abstract":"Static-random-access-memory(SRAM)-based field programmable gate arrays (FPGAs) consists of 50% ~70% routing resources. A simple programmable interconnect point (PIP) is a switch controlled by SRAM configuration cell connecting two wires. A novel traverse algorithm targeted for the detection of PIP open faults is proposed. Experimental results run on the Fudan design system (FDS) platform show that the algorithm is effective to examine the open faults of the routing paths caused by the PIPs fault configuration.","PeriodicalId":436457,"journal":{"name":"2008 9th International Conference on Solid-State and Integrated-Circuit Technology","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"FPGA interconnect testing algorithm based on routing-resource graph\",\"authors\":\"L. Dai, Zhi-bin Liu, Shao-chi Liang, Meng Yang, Ling-li Wang\",\"doi\":\"10.1109/ICSICT.2008.4734988\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Static-random-access-memory(SRAM)-based field programmable gate arrays (FPGAs) consists of 50% ~70% routing resources. A simple programmable interconnect point (PIP) is a switch controlled by SRAM configuration cell connecting two wires. A novel traverse algorithm targeted for the detection of PIP open faults is proposed. Experimental results run on the Fudan design system (FDS) platform show that the algorithm is effective to examine the open faults of the routing paths caused by the PIPs fault configuration.\",\"PeriodicalId\":436457,\"journal\":{\"name\":\"2008 9th International Conference on Solid-State and Integrated-Circuit Technology\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-12-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 9th International Conference on Solid-State and Integrated-Circuit Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSICT.2008.4734988\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 9th International Conference on Solid-State and Integrated-Circuit Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSICT.2008.4734988","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 4

摘要

基于静态随机存取存储器(SRAM)的现场可编程门阵列(fpga)由50% ~70%的路由资源组成。一个简单的可编程互连点(PIP)是由SRAM配置单元控制的连接两条线的开关。提出了一种新的针对PIP开放故障检测的遍历算法。在复旦设计系统(FDS)平台上的实验结果表明，该算法可以有效地检测由pip故障配置引起的路由路径开放故障。

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FPGA interconnect testing algorithm based on routing-resource graph

Static-random-access-memory(SRAM)-based field programmable gate arrays (FPGAs) consists of 50% ~70% routing resources. A simple programmable interconnect point (PIP) is a switch controlled by SRAM configuration cell connecting two wires. A novel traverse algorithm targeted for the detection of PIP open faults is proposed. Experimental results run on the Fudan design system (FDS) platform show that the algorithm is effective to examine the open faults of the routing paths caused by the PIPs fault configuration.

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来源期刊

2008 9th International Conference on Solid-State and Integrated-Circuit Technology

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