软件缺陷预测的集成模型

A. Ali, Attique ur Rehman, Ali Nawaz, Tahir Ali, M. Abbas
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引用次数: 0

摘要

软件测试是保证软件质量的重要手段之一。研究发现,测试成本占整个项目成本的50%以上。有效和高效的软件测试利用了最少的软件资源。因此,构建既能进行高效测试,又能最大限度地减少项目资源利用的程序是非常重要的。软件测试的目标是发现软件系统中的最大缺陷。随着世界不断向数据驱动的方式发展,做出重要的决定。因此,在这篇研究论文中,我们对公开可用的数据集进行了机器学习分析,并试图达到最大的准确性。本文的主要重点是在数据集上应用不同的机器学习技术,并找出哪种技术能产生有效的结果。特别地,我们提出了一个集成学习模型,并在不同的数据集上对KNN、Decision tree、SVM和Naïve Bayes进行了比较分析,结果表明,集成方法在正确率、精密度、召回率和f1分数方面都优于其他方法。在CM1上训练的集成学习模型分类准确率为98.56%,在KM2上训练的集成学习模型分类准确率为98.18%,在PC1上训练的集成学习模型分类准确率为99.27%。这表明,与其他技术相比,集成学习是一种更有效的缺陷预测方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An Ensemble Model for Software Defect Prediction
Software testing is one of the important ways to ensure the quality of software. It is found that testing cost more than 50% of overall project cost. Effective and efficient software testing utilizes the minimum resources of software. Therefore, it is important to construct the procedure which is not only able to perform the efficient testing but also minimizes the utilization of project resources. The goal of software testing is to find maximum defects in the software system. As world is continuously moving toward data driven approach for making important decision. Therefore, in this research paper we performed the machine learning analysis on the publicly available datasets and tried to achieve the maximum accuracy. The major focus of the paper is to apply different machine learning techniques on the datasets and find out which technique produce efficient result. Particularly, we proposed an ensemble learning models and perform comparative analysis among KNN, Decision tree, SVM and Naïve Bayes on different datasets and it is demonstrated that performance of Ensemble method is more than other methods in term of accuracy, precision, recall and F1-score. The classification accuracy of ensemble model trained on CM1 is 98.56%, classification accuracy of ensemble model trained on KM2 is 98.18% similarly, the classification accuracy of ensemble learning model trained on PC1 is 99.27%. This reveals that ensemble learning is more efficient method for making the defect prediction as compared other techniques.
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