集成电路封装组装成品率学习模型

A. Sarwar, S. Balasubramaniam, D. Walker
{"title":"集成电路封装组装成品率学习模型","authors":"A. Sarwar, S. Balasubramaniam, D. Walker","doi":"10.1109/IEMT.1996.559753","DOIUrl":null,"url":null,"abstract":"This paper describes a model for yield learning in integrated circuit package assembly. This model provides a management tool for yield projection, resource allocation and what-if analysis. An Excel spreadsheet-based model was developed using a series of case studies of TCP, PQFP, CBGA, and PBGA packages entering manufacturing. The factors that affect yield learning rates (e.g. process complexity, production volumes, personnel experience) were identified and models successfully built to predict the yield ramp for each product. We found that a common model with a common set of factors and the same relative factor importance could be used for all package technologies.","PeriodicalId":177653,"journal":{"name":"Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium","volume":"125 1-3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Yield learning model for integrated circuit package assembly\",\"authors\":\"A. Sarwar, S. Balasubramaniam, D. Walker\",\"doi\":\"10.1109/IEMT.1996.559753\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a model for yield learning in integrated circuit package assembly. This model provides a management tool for yield projection, resource allocation and what-if analysis. An Excel spreadsheet-based model was developed using a series of case studies of TCP, PQFP, CBGA, and PBGA packages entering manufacturing. The factors that affect yield learning rates (e.g. process complexity, production volumes, personnel experience) were identified and models successfully built to predict the yield ramp for each product. We found that a common model with a common set of factors and the same relative factor importance could be used for all package technologies.\",\"PeriodicalId\":177653,\"journal\":{\"name\":\"Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium\",\"volume\":\"125 1-3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-10-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.1996.559753\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1996.559753","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

本文描述了集成电路封装过程中良率学习的模型。该模型为产量预测、资源分配和假设分析提供了一个管理工具。通过对TCP、PQFP、CBGA和PBGA封装进入制造业的一系列案例研究,开发了一个基于Excel电子表格的模型。确定了影响良率学习率的因素(如工艺复杂性、产量、人员经验),并成功建立了模型来预测每种产品的良率斜坡。我们发现,具有一组共同因素和相同相对因素重要性的共同模型可以用于所有封装技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Yield learning model for integrated circuit package assembly
This paper describes a model for yield learning in integrated circuit package assembly. This model provides a management tool for yield projection, resource allocation and what-if analysis. An Excel spreadsheet-based model was developed using a series of case studies of TCP, PQFP, CBGA, and PBGA packages entering manufacturing. The factors that affect yield learning rates (e.g. process complexity, production volumes, personnel experience) were identified and models successfully built to predict the yield ramp for each product. We found that a common model with a common set of factors and the same relative factor importance could be used for all package technologies.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信