航空电子设备的高加速寿命试验

M. Catelani, L. Ciani
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引用次数: 14

摘要

在航空电子应用中,可靠性是最重要的竞争因素之一,因为故障的发生可能导致飞机的功能进入临界状态。一些航空电子设备是不能容忍故障的,因为寿命可能取决于设备的可靠运行。高加速寿命测试(HALT)是一种时间压缩测试协议,它利用阶跃应力方法使产品承受不同的热应力和振动应力。它用于在初步设计阶段发现设计限制和弱点,帮助设计人员在现场应用程序中出现错误之前发现并修复错误。HALT测试的目标是通过使测试单元逐渐受到更高的应力水平,结合热停留,快速温度转变,变化的振动应力,以及温度和振动的组合来沉淀固有缺陷来破坏产品。本文介绍了航空电子设备的HALT过程,并讨论了具体的试验装置。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Highly Accelerated Life Testing for avionics devices
In avionics application one of the most important competition factors is the reliability, given that the failure occurrence may leads to a critical state for the functioning of the aircraft. Some avionics apparatus are intolerant of failures, as lives may depend on the reliable functioning of equipment. Highly Accelerated Life Testing (HALT) is a time compression testing protocol that utilizes a step stress approach in subjecting products to varied thermal and vibration stresses. It is used to uncover design limitations and weaknesses in the preliminary design phase, helping designers to find and fix errors before they occur during the application in the field. The goal of HALT testing is to break the product by subjecting the test unit to progressively higher stress levels, incorporating thermal dwells, rapid temperature transitions, varied vibration stresses, and a combination of temperature and vibration to precipitate inherent defects. In this paper the HALT process related to an avionic equipment is described and a specific test plant is discussed.
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