互连传输线参数表征

40th ARFTG Conference Digest Pub Date : 1992-12-01 DOI:10.1109/ARFTG.1992.327004

R. Marks, Dylan F. Williams

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引用次数: 21

摘要

本文介绍了一种表征在损耗或色散介质上制作的传输线的新方法。该方法比传统技术更精确，用于检测在损耗硅衬底上制作的单位长度共面波导传输线的电阻、电感、电容和电导。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Interconnection Transmission Line Parameter Characterization

This paper introduces a new method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance, and conductance per unit length of coplanar waveguide transmission lines fabricated on lossy silicon substrates.

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来源期刊

40th ARFTG Conference Digest

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