{"title":"加速试验(电迁移)优化设计误差分析","authors":"D. Hannaman, N. Zamani, J. Dhiman, M. Buehler","doi":"10.1109/RELPHY.1990.66062","DOIUrl":null,"url":null,"abstract":"In accelerated life testing the operating life of a device is determined by extrapolation from the failure data at a set of stress points. A methodology for selecting an optimal set of stress points given a constraint in available test time is discussed. The approach is based on linearizing the failure equation and applying multiple linear regression to obtain the optimal stress points. Specific application is made to Black's model (1982) of electromigration.<<ETX>>","PeriodicalId":409540,"journal":{"name":"28th Annual Proceedings on Reliability Physics Symposium","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Error analysis for optimal design of accelerated tests (electromigration)\",\"authors\":\"D. Hannaman, N. Zamani, J. Dhiman, M. Buehler\",\"doi\":\"10.1109/RELPHY.1990.66062\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In accelerated life testing the operating life of a device is determined by extrapolation from the failure data at a set of stress points. A methodology for selecting an optimal set of stress points given a constraint in available test time is discussed. The approach is based on linearizing the failure equation and applying multiple linear regression to obtain the optimal stress points. Specific application is made to Black's model (1982) of electromigration.<<ETX>>\",\"PeriodicalId\":409540,\"journal\":{\"name\":\"28th Annual Proceedings on Reliability Physics Symposium\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-03-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"28th Annual Proceedings on Reliability Physics Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RELPHY.1990.66062\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"28th Annual Proceedings on Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RELPHY.1990.66062","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Error analysis for optimal design of accelerated tests (electromigration)
In accelerated life testing the operating life of a device is determined by extrapolation from the failure data at a set of stress points. A methodology for selecting an optimal set of stress points given a constraint in available test time is discussed. The approach is based on linearizing the failure equation and applying multiple linear regression to obtain the optimal stress points. Specific application is made to Black's model (1982) of electromigration.<>
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