中子散裂增强介子散射层析成像

C. Grove, C. Eldridge, J. Burns, C. Steer, G. Chapman, A. Lohstroh
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引用次数: 0

摘要

本文介绍了结合介子散射层析成像技术对介子受激中子发射的研究所得的数据。铅中中子发射的初始测量结果为56.9±6.63 ns,比预期低3个标准差,误差主要归因于x射线的提示发射。一个假设的探测器,基于AWE的介子散射层析成像原型,用于检查集成系统的预期数据。寿命为81±3 ns。除此之外,还开发了一种便携式μ子触发检测器,其目的是在可部署的μ子散射层析成像系统中实现。便携式探测器成功地以20%的精度测量μ子。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Neutron spallation to enhance muon scattering tomography
This work presents data obtained from an investigation into muon stimulated neutron emission in combination with the technique of muon scattering tomography. Initial measurements in lead of the neutron emission measured a half-life of 56.9 ± 6.63 ns which is three standard deviations lower than expected, with the error primarily attributed to prompt X-ray emission. A hypothetical detector, based on a muon scattering tomography prototype at AWE was used to examine the data expected from an integrated system. A lifetime 81 ± 3 ns was obtained here. Alongside this a portable muon trigger detector has been developed which aims to be implemented in a deployable muon scattering tomography system. The portable detector successfully measures muons to an accuracy of 20%.
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