早期电网设计:提取、建模和优化

Cheng Zhuo, H. Gan, W. Shih
{"title":"早期电网设计:提取、建模和优化","authors":"Cheng Zhuo, H. Gan, W. Shih","doi":"10.1145/2593069.2593129","DOIUrl":null,"url":null,"abstract":"Many prior works have discussed the power grid design and optimization in the post-layout stage, when design change is inevitably expensive and difficult. In contrast, during the early stage of a development cycle, designers have more flexibility to improve the design quality. However, there are several fundamental challenges at early-stage when design database is NOT complete, including extraction, modeling and optimization. This paper tackles these fundamental issues of early-stage power grid design. The proposed methods have been silicon-validated on 32nm on-market chips and successfully applied to a 22nm design for its early stage power grid design. The findings from such practices reveal that, for sub-32nm chips, intrinsic on-die capacitance and power gate scheme may have more significant impact than expected on power integrity, and need to be well addressed at early stage.","PeriodicalId":433816,"journal":{"name":"2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Early-stage power grid design: Extraction, modeling and optimization\",\"authors\":\"Cheng Zhuo, H. Gan, W. Shih\",\"doi\":\"10.1145/2593069.2593129\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Many prior works have discussed the power grid design and optimization in the post-layout stage, when design change is inevitably expensive and difficult. In contrast, during the early stage of a development cycle, designers have more flexibility to improve the design quality. However, there are several fundamental challenges at early-stage when design database is NOT complete, including extraction, modeling and optimization. This paper tackles these fundamental issues of early-stage power grid design. The proposed methods have been silicon-validated on 32nm on-market chips and successfully applied to a 22nm design for its early stage power grid design. The findings from such practices reveal that, for sub-32nm chips, intrinsic on-die capacitance and power gate scheme may have more significant impact than expected on power integrity, and need to be well addressed at early stage.\",\"PeriodicalId\":433816,\"journal\":{\"name\":\"2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)\",\"volume\":\"64 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/2593069.2593129\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2593069.2593129","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

许多前人的工作都是在布局后阶段讨论电网的设计和优化问题,而在布局后阶段进行设计变更必然是昂贵和困难的。相比之下,在开发周期的早期阶段,设计师有更多的灵活性来提高设计质量。然而,在设计数据库尚未完成的早期阶段,有几个基本的挑战,包括提取、建模和优化。本文解决了这些早期电网设计的基本问题。所提出的方法已在32nm市场芯片上进行了硅验证,并成功应用于22nm设计的早期电网设计。这些实践的结果表明,对于32nm以下的芯片,固有的片上电容和电源栅极方案可能对功率完整性的影响比预期的要大,需要在早期阶段得到很好的解决。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Early-stage power grid design: Extraction, modeling and optimization
Many prior works have discussed the power grid design and optimization in the post-layout stage, when design change is inevitably expensive and difficult. In contrast, during the early stage of a development cycle, designers have more flexibility to improve the design quality. However, there are several fundamental challenges at early-stage when design database is NOT complete, including extraction, modeling and optimization. This paper tackles these fundamental issues of early-stage power grid design. The proposed methods have been silicon-validated on 32nm on-market chips and successfully applied to a 22nm design for its early stage power grid design. The findings from such practices reveal that, for sub-32nm chips, intrinsic on-die capacitance and power gate scheme may have more significant impact than expected on power integrity, and need to be well addressed at early stage.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信