D. Staiculescu, J. Laskar, J. Mendelsohn, E. Sweetman, D. Rudy, I. Anaki
{"title":"Ni-Au表面处理对射频性能的影响","authors":"D. Staiculescu, J. Laskar, J. Mendelsohn, E. Sweetman, D. Rudy, I. Anaki","doi":"10.1109/MWSYM.1999.780347","DOIUrl":null,"url":null,"abstract":"We present a simplified analysis of the Nickel-Gold surface finish effects on microstrip conductive losses for boards with different Ni thickness and Ni/Au finish chemistries. Otherwise identical test structures were fabricated with various Ni/Au finishes and different thicknesses. The conductive loss has been extracted from Q measurements on series microstrip resonators. A theoretical model for conductor loss of a two metal layer system has also been proposed. The theoretical approach has been supported with measurement results. For a specific frequency, conductive loss shows an S-curve behavior with Ni thickness.","PeriodicalId":339267,"journal":{"name":"1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Ni-Au surface finish effects on RF performance\",\"authors\":\"D. Staiculescu, J. Laskar, J. Mendelsohn, E. Sweetman, D. Rudy, I. Anaki\",\"doi\":\"10.1109/MWSYM.1999.780347\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a simplified analysis of the Nickel-Gold surface finish effects on microstrip conductive losses for boards with different Ni thickness and Ni/Au finish chemistries. Otherwise identical test structures were fabricated with various Ni/Au finishes and different thicknesses. The conductive loss has been extracted from Q measurements on series microstrip resonators. A theoretical model for conductor loss of a two metal layer system has also been proposed. The theoretical approach has been supported with measurement results. For a specific frequency, conductive loss shows an S-curve behavior with Ni thickness.\",\"PeriodicalId\":339267,\"journal\":{\"name\":\"1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282)\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-06-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1999.780347\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1999.780347","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We present a simplified analysis of the Nickel-Gold surface finish effects on microstrip conductive losses for boards with different Ni thickness and Ni/Au finish chemistries. Otherwise identical test structures were fabricated with various Ni/Au finishes and different thicknesses. The conductive loss has been extracted from Q measurements on series microstrip resonators. A theoretical model for conductor loss of a two metal layer system has also been proposed. The theoretical approach has been supported with measurement results. For a specific frequency, conductive loss shows an S-curve behavior with Ni thickness.