电源降噪技术的设计与验证

G. Ji, T. Arabi, G. Taylor
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引用次数: 12

摘要

在高性能微处理器中,为了保证高速总线的可靠运行,需要对电源噪声进行控制。这通常是用高质量的封装电容器完成的。这些电容器一般是低等效串联电感(ESL)和低等效串联电阻(ESR)。与传统方法相反,我们将证明小的ESR不是最佳的。我们将提出一种利用片上电阻与封装电容串联的新方法来抑制高频噪声。我们将通过对90nm技术的验证来证明,该技术能够在不影响时序的情况下将噪声降低近80%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design and validation of a power supply noise reduction technique
In high performance microprocessors, power supply noise needs to be controlled to ensure reliable high speed bus operation. This is generally done with high quality package capacitors. These capacitors are generally lower equivalent series inductance (ESL) and lower equivalent series resistor (ESR). Contrary to the traditional approach, we will show that a small ESR is not optimal. We will present a novel approach of using an on-die resistor in series with the package capacitance to dampen the high frequency noise. We will show by validation on the 90nm technology that this technique is capable of reducing the noise by nearly 80% without adversely affecting the timings.
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