冗余Split-CDAC SAR adc中电容失配和比较偏置的数字校正

Antonio Lopez-Angulo, A. Ginés, E. Peralías
{"title":"冗余Split-CDAC SAR adc中电容失配和比较偏置的数字校正","authors":"Antonio Lopez-Angulo, A. Ginés, E. Peralías","doi":"10.1109/newcas49341.2020.9159766","DOIUrl":null,"url":null,"abstract":"This work introduces a digital technique to measure and correct the mismatch between capacitors in SAR ADCs with split capacitor-based DAC (CDAC), including the bridge capacitor impairments. The method takes advantage of redundancy for calibration with negligible impact on the analog section. It reuses some of the capacitors in the array to also compensate the comparison offset, preventing redundancy interval saturation during the error measurement phase. The effectiveness of the method is demonstrated by realistic behavioral simulations in a 12-bit split-CDAC SAR ADC case study.","PeriodicalId":135163,"journal":{"name":"2020 18th IEEE International New Circuits and Systems Conference (NEWCAS)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Digital calibration of capacitor mismatch and comparison offset in Split-CDAC SAR ADCs with redundancy\",\"authors\":\"Antonio Lopez-Angulo, A. Ginés, E. Peralías\",\"doi\":\"10.1109/newcas49341.2020.9159766\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work introduces a digital technique to measure and correct the mismatch between capacitors in SAR ADCs with split capacitor-based DAC (CDAC), including the bridge capacitor impairments. The method takes advantage of redundancy for calibration with negligible impact on the analog section. It reuses some of the capacitors in the array to also compensate the comparison offset, preventing redundancy interval saturation during the error measurement phase. The effectiveness of the method is demonstrated by realistic behavioral simulations in a 12-bit split-CDAC SAR ADC case study.\",\"PeriodicalId\":135163,\"journal\":{\"name\":\"2020 18th IEEE International New Circuits and Systems Conference (NEWCAS)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 18th IEEE International New Circuits and Systems Conference (NEWCAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/newcas49341.2020.9159766\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 18th IEEE International New Circuits and Systems Conference (NEWCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/newcas49341.2020.9159766","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

这项工作介绍了一种数字技术来测量和纠正SAR adc中基于分裂电容的DAC (CDAC)中电容之间的不匹配,包括桥式电容损伤。该方法利用冗余进行校准,对模拟部分的影响可以忽略不计。它重用阵列中的一些电容来补偿比较偏移,防止在误差测量阶段冗余间隔饱和。通过对一个12位分路cdac SAR ADC的实际行为仿真,验证了该方法的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Digital calibration of capacitor mismatch and comparison offset in Split-CDAC SAR ADCs with redundancy
This work introduces a digital technique to measure and correct the mismatch between capacitors in SAR ADCs with split capacitor-based DAC (CDAC), including the bridge capacitor impairments. The method takes advantage of redundancy for calibration with negligible impact on the analog section. It reuses some of the capacitors in the array to also compensate the comparison offset, preventing redundancy interval saturation during the error measurement phase. The effectiveness of the method is demonstrated by realistic behavioral simulations in a 12-bit split-CDAC SAR ADC case study.
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