{"title":"信号源、传感器、开关和监视器的统一控制接口","authors":"I. Neag, S. Gal","doi":"10.1109/AUTEST.2003.1243585","DOIUrl":null,"url":null,"abstract":"The paper describes a new interface design for instrument drivers, which enables the signal-oriented control of instruments that generate, measure, monitor and switch signals. The interface also supports the synchronized operation of signal sources, sensors and switches. The utilization of the interface provides a high degree of instrument interchangeability and simplifies the development of signal drivers and test applications.","PeriodicalId":385780,"journal":{"name":"Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference.","volume":"134 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A unified control interface for signal sources, sensors, switches and monitors\",\"authors\":\"I. Neag, S. Gal\",\"doi\":\"10.1109/AUTEST.2003.1243585\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper describes a new interface design for instrument drivers, which enables the signal-oriented control of instruments that generate, measure, monitor and switch signals. The interface also supports the synchronized operation of signal sources, sensors and switches. The utilization of the interface provides a high degree of instrument interchangeability and simplifies the development of signal drivers and test applications.\",\"PeriodicalId\":385780,\"journal\":{\"name\":\"Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference.\",\"volume\":\"134 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-11-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2003.1243585\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2003.1243585","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A unified control interface for signal sources, sensors, switches and monitors
The paper describes a new interface design for instrument drivers, which enables the signal-oriented control of instruments that generate, measure, monitor and switch signals. The interface also supports the synchronized operation of signal sources, sensors and switches. The utilization of the interface provides a high degree of instrument interchangeability and simplifies the development of signal drivers and test applications.