{"title":"最灵活的系统组件","authors":"M. Lombardi","doi":"10.1109/AUTEST.2009.5314034","DOIUrl":null,"url":null,"abstract":"Oscilloscopes are often found in ATE systems as debug tools. But the high speed capture capabilities can expand their application into a multitude of anticipated and unanticipated testing needs. This paper intends to extend the reader's understanding of the inherent measurement possibilities afforded by this important system component.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The most flexible system component\",\"authors\":\"M. Lombardi\",\"doi\":\"10.1109/AUTEST.2009.5314034\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Oscilloscopes are often found in ATE systems as debug tools. But the high speed capture capabilities can expand their application into a multitude of anticipated and unanticipated testing needs. This paper intends to extend the reader's understanding of the inherent measurement possibilities afforded by this important system component.\",\"PeriodicalId\":187421,\"journal\":{\"name\":\"2009 IEEE AUTOTESTCON\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-11-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2009.5314034\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2009.5314034","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Oscilloscopes are often found in ATE systems as debug tools. But the high speed capture capabilities can expand their application into a multitude of anticipated and unanticipated testing needs. This paper intends to extend the reader's understanding of the inherent measurement possibilities afforded by this important system component.
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