高性能ALD HfO/sub 2/-Al/sub 2/O/sub 3/层压式MIM电容器,适用于射频和混合信号IC应用

Hang Hu, S. Ding, H.F. Lim, Chunxiang Zhu, M. Li, S.J. Kim, X.F. Yu, J.H. Chen, Y. F. Yong, B. Cho, D. Chan, S. Rustagi, M. Yu, C. Tung, A. Du, D. My, P.D. Foot, A. Chin, D. Kwong
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引用次数: 10

摘要

本文首次展示了一种高性能ALD HfO/sub - 2/-Al/sub - 2/O/sub - 3/层压板金属-绝缘体-金属(MIM)电容器,在10 kHz至20 GHz范围内具有12.8 fF//spl μ /m/sup 2/的高电容密度,在2 V时漏电流低至7.45/spl次/10/sup -9/ a /cm/sup 2/, VCC(电容电压系数)低,可靠性好。ALD HfO/sub - 2/-Al/sub - 2/O/sub - 3/层压板具有优异的电学性能和可靠性,是一种非常有前途的用于Si射频和混合信号IC应用的MIM电容器材料。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High performance ALD HfO/sub 2/-Al/sub 2/O/sub 3/ laminate MIM capacitors for RF and mixed signal IC applications
In this paper, a high performance ALD HfO/sub 2/-Al/sub 2/O/sub 3/ laminate metal-insulator-metal (MIM) capacitor is demonstrated for the first time with high capacitance density of 12.8 fF//spl mu/m/sup 2/ from 10 kHz to 20 GHz, low leakage current of 7.45/spl times/10/sup -9/ A/cm/sup 2/ at 2 V, low VCC (voltage coefficients of capacitance), and excellent reliability. The superior electrical properties and reliability suggest that the ALD HfO/sub 2/-Al/sub 2/O/sub 3/ laminate is a very promising material for MIM capacitors for Si RF and mixed signal IC applications.
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