基于体效应补偿的自举栅极MOS采样保持电路失真降低技术

S. Sen, K. Shaik, J. Mukherjee, P. Dhalvaniya
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引用次数: 3

摘要

提出了一种自举门采样保持电路的畸变改善技术。通过消除阈值电压的体效应引起的变化,使MOS采样开关的栅极过驱动电压和电导保持恒定。放大器用于在自举门路径中提供适当的增益。该技术通过将增益调整为Ag =1+kγ1(其中kγ1是阈值电压对源电压的灵敏度)来实现二次谐波失真(HD2)的最小化。此外,S/H失真对放大器运算放大器特性不敏感。采用0.18 μm CMOS技术的单端S/H放大器的芯片原型测量结果表明,HD2比传统的自举门S/H提高了11 dB。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A distortion reduction technique for bootstrapped-gate MOS Sample-and-Hold circuits using body-effect compensation
A distortion improvement technique for bootstrapped-gate Sample-and-Hold (S/H) circuits, is proposed. The gate overdrive voltage and conductance of the MOS sampling switch are made constant by cancelling the body-effect induced variations in the threshold-voltage. An amplifier is used to provide appropriate gain in the bootstrapped-gate path. The technique allows the minimized second-harmonic distortion (HD2) by adjusting the gain to Ag =1+kγ1, where kγ1 is the sensitivity of threshold voltage to the source voltage. Furthermore, the S/H distortion remains insensitive to the amplifier op-amp characteristics. Chip prototype measurement results of a single-ended S/H amplifier using 0.18 μm CMOS technology show HD2 improvement of 11 dB over conventional bootstrapped-gate S/H.
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