堆叠式RFID标签的性能分析

Feng Lu, Xiaosheng Chen, Terry Tao Ye
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引用次数: 44

摘要

大多数RFID标签性能分析是基于标签在与阅读器交互时是独立的假设。然而,在现实世界中,RFID标签在部署时经常堆叠在一起,即RFID标签的纸箱堆叠在托盘上。当多个RFID标签天线彼此靠近放置时,每个天线的行为就像一个屏蔽和反射物体,并且辐射方向图和其他EM特性将被调谐。堆叠影响通常会导致性能下降,在许多情况下还会导致读写失败。本文首先推导了一个RCS模型,将负载天线推广为屏蔽和反射对象。然后引入归一化的多天线互阻抗矩阵来描述堆叠天线之间的耦合效应。为了量化和可视化现实世界场景中的堆叠影响,我们还在Agilent®AMDS中构建了一个3- d EM模型,该模型由27个(3 × 3 × 3)堆叠的纸箱组成,每个纸箱表面都附有Alien®标签。我们的理论计算与仿真结果一致,表明标签的辐射方向图和其他电磁特性都会被相邻标签极大地改变。与独立场景下的标签相比,不同位置的退化可能非常显著(在某些方向上超过6dB)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Performance analysis of stacked RFID tags
Most RFID tag performance analysis is based on the assumption that the tag is stand-alone when interacting with the readers. However, in the real world, RFID tags are often stacked together when deployed, i.e., RFID-labeled carton boxes stacked on the pallet. When multiple RFID tag antennas are placed close to each other, each antenna behaves like a shielding and reflecting object to others and the radiation pattern and other EM properties will be detuned. The stacking impact often leads to performance degradation and in many cases, read and write failure. In this paper, we first derive an RCS model to generalize a loaded antenna as a shielding and reflecting object. We then introduce a normalized mutual impedance matrix of multiple antennas to formulate the coupling effects among stacked antennas. To quantify and visualize the stacking impact in a real world scenario, we also construct a 3-D EM model in Agilent® AMDS consisting of 27 (3 × 3 × 3) stacked carton boxes, each with Alien® tags attached on the surface. Our theoretical calculation agrees with the simulation and shows that both tag radiation pattern and other EM properties will be greatly altered by neighboring tags. Compared with tags in stand-alone scenarios, the degradation at different positions could be very significant (more than 6dB in some directions).
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