用于宽带动态电压和频率缩放操作的FPGA LUT设计(仅摘要)

M. Abusultan, S. Khatri
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摘要

现场可编程门阵列(fpga)是设计灵活性的首选实现平台。然而,fpga的高功耗(由于其灵活的结构而产生)使它们对极低功耗应用的吸引力降低。在本文中,我们提出了一种FPGA查找表(LUT)的设计,其目标是在宽电源电压范围内无缝运行。同样的LUT设计能够在需要低功耗时在亚阈值电压下工作,在需要更快性能时在更高电压下工作。结果表明,对于采用22nm预测技术实现的6输入LUT,在亚阈值模式下操作LUT的功率和能量比完全供电电压工作低(~80x)和(~4x)。亚阈值操作的主要缺点是易受工艺、温度和电源电压(PVT)变化的影响。本文还介绍了一种闭环自适应偏置机构的设计和实验结果,以动态消除这些PVT变化。对于相同的22nm技术,我们证明了闭环自适应体偏置电路可以允许FPGA在跨越一个数量级(40 MHz至1300 MHz)的工作频率范围内工作。我们还表明,闭环自适应体偏置电路可以消除由电源电压变化引起的延迟变化,并将工艺变化对设置和保持时间的影响分别减少1.8倍和2.9倍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
FPGA LUT design for wide-band dynamic voltage and frequency scaled operation (abstract only)
Field programmable gate arrays (FPGAs) are the implementation platform of choice when it comes to design flexibility. However, the high power consumption of FPGAs (which arises due to their flexible structure), make them less appealing for extreme low power applications. In this paper, we present a design of an FPGA look-up table (LUT), with the goal of seamless operation over a wide band of supply voltages. The same LUT design has the ability to operate at sub-threshold voltage when low power is required, and at higher voltages whenever faster performance is required. The results show that operating the LUT in sub-threshold mode yields a (~80x) lower power and (~4x) lower energy than full supply voltage operation, for a 6-input LUT implemented in a 22nm predictive technology. The key drawback of sub-threshold operation is its susceptibility to process, temperature, and supply voltage (PVT) variations. This paper also presents the design and experimental results for a closed-loop adaptive body biasing mechanism to dynamically cancel these PVT variations. For the same 22nm technology, we demonstrate that the closed-loop adaptive body biasing circuits can allow the FPGA to operate over an operating frequency range that spans an order of magnitude (40 MHz to 1300 MHz). We also show that the closed-loop adaptive body biasing circuits can cancel delay variations due to supply voltage changes, and reduce the effect of process variations on setup and hold times by 1.8x and 2.9x respectively.
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