TeakLite核心的测试准备核心设计

AP-ASIC'99. First IEEE Asia Pacific Conference on ASICs (Cat. No.99EX360) Pub Date : 1999-08-23 DOI:10.1109/APASIC.1999.824107

Heemin Park, Gyoochan Sim, Jaehoon Jung, H. Jun

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引用次数: 0

摘要

本文介绍了TeakLite岩芯的可测试型岩芯设计方法。提出了使用最小测试引脚访问测试、扫描链重构和UDL测试能力的实现问题和技术。本文还描述了开发高质量测试载体的可测试性增强。结果，达到了99.68%的非常高的故障覆盖率。我们还介绍了可测试TeakLite核心的特性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Test ready core design for TeakLite core

This paper describes test ready core design methodology for TeakLite core. Implementation issues and techniques about test access with minimal test pins, scan chain reconfiguration, and UDL test capability are presented. Testability enhancement for development of high quality test vector is also described. As the result, a very high fault coverage of 99.68% has been achieved. We also present the features of test ready TeakLite core.

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AP-ASIC'99. First IEEE Asia Pacific Conference on ASICs (Cat. No.99EX360)

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