低能电子辐照诱导介电材料带电:测量与分析

M. Belhaj, S. Dadouch
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引用次数: 2

摘要

在许多空间应用中,介电材料在电子辐照下的充电是一个常见的问题。航天器在充电时受到太阳和宇宙辐射的影响,可能导致临界放电现象。事实上,在辐照(特别是电子辐照)下,绝缘体和浮动导体可能带负电荷或正电荷,这取决于入射电子的性质(能量、入射角、通量)和特定的材料性质(成分、表面粗糙度、污染程度、温度等)。航天器等离子体相互作用软件需要对航天器的每种材料进行辐照。利用高速半球形电子能量分析仪对发射的二次电子和背散射电子的能量分布进行了动态测量。辐照样品表面电位的演变可以由二次电子的能量位移推导出来。该方法适用于25µm Kapton。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Low Energy Electron Irradiation Induced Charging of Dielectric Materials: Measurements and Analyses
Charging of dielectric materials under electron irradiation is a commonly encountered problem in many space applications. Spacecraft charging due to solar and cosmic radiations may lead to critical discharge phenomenon. Indeed, under irradiation (especially electron irradiation), insulators as well as floating conductors may charge negatively or positively depending on the incident electron properties (energy, incidence angle, flux) and on the specific material properties (composition, surface roughness, contamination, temperature, etc.) The knowledge of the electrical properties electron emission yield, conductivity and radiation induced conductivity) under electron, irradiation for each material of the spacecraft is needed for spacecraft plasma interaction software. The energy distribution of the emitted secondary and backscattered electrons was measured dynamically with the help of high-speed hemispherical electron energy analyzer. The evolution of the surface potential of the irradiated sample can be derived from the energy shift of the secondary electron pic. The method is applied to 25-µm Kapton.
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