Maria Fernanda Villa Bracamonte, J. R. M. Bojorquez, A. Ayón
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Complex Refractive Index and Complex Dielectric Function Modeling of Film Stack in Perovskite Solar Cells using Spectroscopic Ellipsometry
We report a comprehensive single layer modeling approach to investigate the complex refractive index of ITO, PEDOT:PSS, MAPbI3 perovskite film stack deposited on a glass substrate. The optical constants such as refractive index and extinction coefficient as well as the complex dielectric function are studied by spectroscopy ellipsometry, We propose that spectroscopic ellipsometry characterization can be used at the different stages of the fabrication process of each layer to study the mechanisms that impact the final performance of a photovoltaic device.
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