相变存储器中读干扰错误的按需清洗解决方案

Moon-Gone Kim, Hyuk-Jae Lee, Hyun Kim
{"title":"相变存储器中读干扰错误的按需清洗解决方案","authors":"Moon-Gone Kim, Hyuk-Jae Lee, Hyun Kim","doi":"10.1109/ICEIC49074.2020.9051213","DOIUrl":null,"url":null,"abstract":"Phase-change memory is a promising memory technology due to its attractive properties. However, phase-change memory is difficult to be commercialized because of its reliability issues. A read disturbance error, which is the main cause of reliability issues, occurs when a cell is repeatedly read. Conventional solution for read disturbance errors is periodically scrubbing the cells. However, this method requires read counters to count the number of reads per word. This paper proposes on-demand scrubbing solution which does not need read counters. The proposed method observes the number of errors in a word using the error-correcting code. If the number of errors is larger than the threshold, a scrubbing is performed to fix the errors. The proposed method removes nearly 1GB of hardware overhead caused by read counters, and fixes more than 99.99% of read disturbance errors.","PeriodicalId":271345,"journal":{"name":"2020 International Conference on Electronics, Information, and Communication (ICEIC)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An On-Demand Scrubbing Solution for Read Disturbance Error in Phase-Change Memory\",\"authors\":\"Moon-Gone Kim, Hyuk-Jae Lee, Hyun Kim\",\"doi\":\"10.1109/ICEIC49074.2020.9051213\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Phase-change memory is a promising memory technology due to its attractive properties. However, phase-change memory is difficult to be commercialized because of its reliability issues. A read disturbance error, which is the main cause of reliability issues, occurs when a cell is repeatedly read. Conventional solution for read disturbance errors is periodically scrubbing the cells. However, this method requires read counters to count the number of reads per word. This paper proposes on-demand scrubbing solution which does not need read counters. The proposed method observes the number of errors in a word using the error-correcting code. If the number of errors is larger than the threshold, a scrubbing is performed to fix the errors. The proposed method removes nearly 1GB of hardware overhead caused by read counters, and fixes more than 99.99% of read disturbance errors.\",\"PeriodicalId\":271345,\"journal\":{\"name\":\"2020 International Conference on Electronics, Information, and Communication (ICEIC)\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 International Conference on Electronics, Information, and Communication (ICEIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEIC49074.2020.9051213\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 International Conference on Electronics, Information, and Communication (ICEIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEIC49074.2020.9051213","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

相变存储以其独特的特性成为一种很有发展前途的存储技术。然而,由于其可靠性问题,相变存储器难以实现商业化。读取干扰错误是可靠性问题的主要原因,发生在重复读取单元格时。读取干扰错误的传统解决方法是周期性地对单元进行清洗。然而,这种方法需要读取计数器来计算每个单词的读取次数。提出了一种不需要读取计数器的按需清洗方案。该方法使用纠错码来观察单词中的错误数。如果错误数量大于阈值,则执行清理以修复错误。该方法消除了由读计数器引起的近1GB的硬件开销,修复了99.99%以上的读干扰错误。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An On-Demand Scrubbing Solution for Read Disturbance Error in Phase-Change Memory
Phase-change memory is a promising memory technology due to its attractive properties. However, phase-change memory is difficult to be commercialized because of its reliability issues. A read disturbance error, which is the main cause of reliability issues, occurs when a cell is repeatedly read. Conventional solution for read disturbance errors is periodically scrubbing the cells. However, this method requires read counters to count the number of reads per word. This paper proposes on-demand scrubbing solution which does not need read counters. The proposed method observes the number of errors in a word using the error-correcting code. If the number of errors is larger than the threshold, a scrubbing is performed to fix the errors. The proposed method removes nearly 1GB of hardware overhead caused by read counters, and fixes more than 99.99% of read disturbance errors.
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