FPGA中的容错性聚焦于降低功耗或提高性能

C. Leong, J. Semião, Marcelino B. Santos, I. Teixeira, João Paulo Teixeira
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引用次数: 0

摘要

本文的目的是为基于fpga的设计提供一种容错方法,专注于在现场操作期间降低功耗或提高性能。该方法基于一种新的性能传感器,该传感器可以预测检测关键路径上的错误,从而降低电源电压(VDD)或提高时钟频率(fclk),从而降低功耗或提高性能。HDL传感器的功能由设计者根据FPGA结构中的目标电路配置来定义。自适应方案使用自动电压和频率控制器(AVFC)来修改fclk和/或VDD,同时仍然保证安全运行。内置传感器可识别由参数变化和/或老化引起的电路运行期间和产品寿命期间预先确定的关键路径的性能偏差。通过减少由标准模拟工具定义的悲观安全边际来解释可变性,使fclk的增加成为可能。传感器的延迟裕度是可编程的,因此有足够的延迟裕度可以保证传感器的安全运行。相反,使用较低的VDD可以实现相同的性能。Virtex 5和Spartan 6 fpga的仿真和实验结果表明,使用这种方法可以实现显着的性能改进(通常为30%)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fault-tolerance in FPGA focusing power reduction or performance enhancement
The purpose of this paper is to present a Fault-Tolerance methodology for FPGA-based designs, focusing power reduction or performance enhancement during on-field operation. The methodology is based on a new performance sensor which predictively detects errors in critical paths, either allowing power-supply voltage (VDD) to be reduced, or clock frequency (fclk) to be raised, driving power reduction or performance increase. The HDL sensor's functionality is defined by the designer, according to the target circuit configuration in the FPGA structure. The adaptive scheme uses an Automatic Voltage and Frequency Controller (AVFC) to modify fclk and/or VDD, while still guaranteeing safe operation. The built-in sensors identify performance deviations in pre-identified critical paths during circuit operation and along product lifetime, caused by parametric variations and/or aging. The fclk increase is made possible by reducing the pessimistic safety-margins defined by standard simulation tools to account for variability. The sensors delay margins are programmable, so an adequate delay margin can guarantee safe operation. Conversely, the same performance can be achieved with lower VDD. Simulation and experimental results with Virtex 5 and Spartan 6 FPGAs show that significant performance improvements (typically, 30%) can be achieved with this methodology.
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