{"title":"具有全内反射的交互折射","authors":"Scott Davis, Chris Wyman","doi":"10.1145/1268517.1268548","DOIUrl":null,"url":null,"abstract":"A requirement for rendering realistic images interactively is efficiently simulating material properties. Recent techniques have improved the quality for interactively rendering dielectric materials, but have mostly neglected a phenomenon associated with refraction, namely, total internal reflection. We present an algorithm to approximate total internal reflection on commodity graphics hardware using a ray-depth map intersection technique that is interactive and requires no precomputation. Our results compare favorably with ray traced images and improve upon approaches that avoid total internal reflection.","PeriodicalId":197912,"journal":{"name":"International Genetic Improvement Workshop","volume":"143 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"37","resultStr":"{\"title\":\"Interactive refractions with total internal reflection\",\"authors\":\"Scott Davis, Chris Wyman\",\"doi\":\"10.1145/1268517.1268548\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A requirement for rendering realistic images interactively is efficiently simulating material properties. Recent techniques have improved the quality for interactively rendering dielectric materials, but have mostly neglected a phenomenon associated with refraction, namely, total internal reflection. We present an algorithm to approximate total internal reflection on commodity graphics hardware using a ray-depth map intersection technique that is interactive and requires no precomputation. Our results compare favorably with ray traced images and improve upon approaches that avoid total internal reflection.\",\"PeriodicalId\":197912,\"journal\":{\"name\":\"International Genetic Improvement Workshop\",\"volume\":\"143 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"37\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Genetic Improvement Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1268517.1268548\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Genetic Improvement Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1268517.1268548","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Interactive refractions with total internal reflection
A requirement for rendering realistic images interactively is efficiently simulating material properties. Recent techniques have improved the quality for interactively rendering dielectric materials, but have mostly neglected a phenomenon associated with refraction, namely, total internal reflection. We present an algorithm to approximate total internal reflection on commodity graphics hardware using a ray-depth map intersection technique that is interactive and requires no precomputation. Our results compare favorably with ray traced images and improve upon approaches that avoid total internal reflection.