一种基于FPGA的机器学习快速调试方法

D. H. Noronha, Ruizhe Zhao, Zhiqiang Que, Jeffrey B. Goeders, W. Luk, S. Wilton
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引用次数: 7

摘要

在可重构技术上设计这些电路是具有挑战性的,特别是由于只有当电路高速运行时才会出现芯片上的错误。在本文中,我们提出了一个灵活的调试覆盖系列,为机器学习应用程序提供类似软件的调试时间。在编译时,将覆盖层添加到设计中并进行编译。在调试时,可以将覆盖层配置为记录有关已识别权重和激活矩阵的统计信息;可以在调试迭代之间更改此配置,允许用户记录不同的矩阵集,或者记录关于观察到的矩阵的不同信息。重要的是,调试迭代之间不需要重新编译。尽管与固定插装相比,我们的覆盖的灵活性承受了一些开销,但我们认为,不需要重新编译就可以更改调试场景的能力可能是引人注目的,并且超过了许多应用程序较高开销的缺点。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An Overlay for Rapid FPGA Debug of Machine Learning Applications
FPGAs show promise as machine learning accelerators for both training and inference. Designing these circuits on reconfigurable technology is challenging, especially due to bugs that only manifest on-chip when the circuit is running at speed. In this paper, we propose a flexible debug overlay family that provides software-like debug times for machine learning applications. At compile time, the overlay is added to the design and compiled. At debug time, the overlay can be configured to record statistical information about identified weight and activation matrices; this configuration can be changed between debug iterations allowing the user to record a different set of matrices, or record different information about the observed matrices. Importantly, no recompilation is required between debug iterations. Although the flexibility of our overlay suffers some overhead compared to fixed instrumentation, we argue that the ability to change the debugging scenario without requiring a recompilation may be compelling and outweigh the disadvantage of higher overhead for many applications.
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