{"title":"基于不同材料的单电子晶体管的仿真","authors":"I. I. Abramov, E. Novik","doi":"10.1109/CRMICO.1999.815242","DOIUrl":null,"url":null,"abstract":"The theoretical investigation of the constructive-technological and electrophysical parameters influencing the single-electron transistor characteristics (temperature of operation, frequency limit, current-voltage characteristic) is carried out. The single-electron device simulator SET-NANODEV was used for the investigations. The single-electron transistors based on different metals were considered. Behavior of the single-electron transistor characteristics depending on material and construction parameters was determined.","PeriodicalId":326430,"journal":{"name":"1999 9th International Crimean Microwave Conference 'Microwave and Telecommunication Technology'. Conference Proceedings (IEEE Cat. No.99EX363)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Simulation of the single-electron transistors based on different materials\",\"authors\":\"I. I. Abramov, E. Novik\",\"doi\":\"10.1109/CRMICO.1999.815242\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The theoretical investigation of the constructive-technological and electrophysical parameters influencing the single-electron transistor characteristics (temperature of operation, frequency limit, current-voltage characteristic) is carried out. The single-electron device simulator SET-NANODEV was used for the investigations. The single-electron transistors based on different metals were considered. Behavior of the single-electron transistor characteristics depending on material and construction parameters was determined.\",\"PeriodicalId\":326430,\"journal\":{\"name\":\"1999 9th International Crimean Microwave Conference 'Microwave and Telecommunication Technology'. Conference Proceedings (IEEE Cat. No.99EX363)\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 9th International Crimean Microwave Conference 'Microwave and Telecommunication Technology'. Conference Proceedings (IEEE Cat. No.99EX363)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CRMICO.1999.815242\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 9th International Crimean Microwave Conference 'Microwave and Telecommunication Technology'. Conference Proceedings (IEEE Cat. No.99EX363)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CRMICO.1999.815242","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Simulation of the single-electron transistors based on different materials
The theoretical investigation of the constructive-technological and electrophysical parameters influencing the single-electron transistor characteristics (temperature of operation, frequency limit, current-voltage characteristic) is carried out. The single-electron device simulator SET-NANODEV was used for the investigations. The single-electron transistors based on different metals were considered. Behavior of the single-electron transistor characteristics depending on material and construction parameters was determined.