双路,1200v, 400a,碳化硅功率MOSFET模块的性能

D. Urciuoli, R. Green, A. Lelis, D. Ibitayo
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引用次数: 20

摘要

采用16个碳化硅(SiC) 0.56 cm2 DMOSFET芯片和12个SiC 0.48 cm2 JBS二极管芯片,在半桥结构中构建了双1200v, 400a功率模块。该模块包括高温定制封装和集成的液冷散热器,同时符合商用双IGBT封装的占地面积和引脚。不使用模具封装剂,以便通过红外热成像收集数据。该模块的直流测试电流高达400 A,冷却液温度高达100°C。在负载功率高达25 kW、频率高达30 kHz、冷却剂温度高达80°C的升压变换器中进行了开关评估。在开关频率和冷却剂温度范围内观察到MOSFET芯片之间可接受的电流共享。对封装热阻、MOSFET和二极管功率损耗进行了表征。结果与400a IGBT模块的仿真结果进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Performance of a dual, 1200 V, 400 A, silicon-carbide power MOSFET module
A dual 1200 V, 400 A power module was built in a half-bridge configuration using 16 silicon-carbide (SiC) 0.56 cm2 DMOSFET die and 12 SiC 0.48 cm2 JBS diode die. The module included high temperature custom packaging and an integrated liquid cooled heat sink while conforming to the footprint and pinout of a commercial dual IGBT package. Die encapsulant was not used, to allow data collection by infrared thermal imaging. The module was DC tested at currents up to 400 A and coolant temperatures up to 100 °C. Switching was evaluated in a boost converter at load power levels up to 25 kW and at frequencies up to 30 kHz with coolant temperatures up to 80 °C. Acceptable current sharing between MOSFET die was observed over the switching frequency and coolant temperature ranges. Package thermal resistances and MOSFET and diode power losses were characterized. Results were compared to those simulated for a 400 A IGBT module.
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