{"title":"基于SVM的JPEG图像25%低嵌入特征盲隐写交叉验证结果分析","authors":"Deepa D. Shankar, Vinod Kumar Shukla","doi":"10.1109/ICCSDET.2018.8821059","DOIUrl":null,"url":null,"abstract":"This paper presents a result analysis of steganalysis of normal JPEG images as compared to the images that have undergone a cross-validation. Four different algorithms, in spatial and transform domain is used for steganography. They are LSB Matching, LSB Replacement, Pixel Value Differencing and F5. The embedding percentage considered in this paper is 25. The features considered for analysis are First Order features, Second Order features, Extended DCT features and Markov features. The classifier used here is Support Vector Machine. A different sampling of data is considered for classification.","PeriodicalId":157362,"journal":{"name":"2018 International Conference on Circuits and Systems in Digital Enterprise Technology (ICCSDET)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Result Analysis of Cross-Validation on low embedding Feature-based Blind Steganalysis of 25 percent on JPEG images using SVM\",\"authors\":\"Deepa D. Shankar, Vinod Kumar Shukla\",\"doi\":\"10.1109/ICCSDET.2018.8821059\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a result analysis of steganalysis of normal JPEG images as compared to the images that have undergone a cross-validation. Four different algorithms, in spatial and transform domain is used for steganography. They are LSB Matching, LSB Replacement, Pixel Value Differencing and F5. The embedding percentage considered in this paper is 25. The features considered for analysis are First Order features, Second Order features, Extended DCT features and Markov features. The classifier used here is Support Vector Machine. A different sampling of data is considered for classification.\",\"PeriodicalId\":157362,\"journal\":{\"name\":\"2018 International Conference on Circuits and Systems in Digital Enterprise Technology (ICCSDET)\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 International Conference on Circuits and Systems in Digital Enterprise Technology (ICCSDET)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCSDET.2018.8821059\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Conference on Circuits and Systems in Digital Enterprise Technology (ICCSDET)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCSDET.2018.8821059","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Result Analysis of Cross-Validation on low embedding Feature-based Blind Steganalysis of 25 percent on JPEG images using SVM
This paper presents a result analysis of steganalysis of normal JPEG images as compared to the images that have undergone a cross-validation. Four different algorithms, in spatial and transform domain is used for steganography. They are LSB Matching, LSB Replacement, Pixel Value Differencing and F5. The embedding percentage considered in this paper is 25. The features considered for analysis are First Order features, Second Order features, Extended DCT features and Markov features. The classifier used here is Support Vector Machine. A different sampling of data is considered for classification.