离子探针和荧光共聚焦显微镜研究掺铒光纤中掺杂物分布

ACOFT/AOS 2006 - Australian Conference on Optical Fibre Technology/Australian Optical Society Pub Date : 2006-07-10 DOI:10.1109/ACOFT.2006.4519301

F. Sidiroglou, R. Stern, I. R. Fletcher, S. Huntington, G. Baxter, A. Roberts

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引用次数: 0

摘要

本文介绍并比较了利用基于荧光强度的共聚焦显微镜技术和纳米级二次离子质谱(NanoSIMS)系统获得的掺铒光纤中的掺杂物分布。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Investigation of dopant profiles in erbium doped optical fibres by ion microprobe and fluorescence confocal microscopy

Dopant profiles in erbium doped optical fibres acquired by the application of fluorescence intensity based confocal microscopy technique and the employment of a nanoscale-secondary ion mass spectrometry (NanoSIMS) system are presented and compared.

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来源期刊

ACOFT/AOS 2006 - Australian Conference on Optical Fibre Technology/Australian Optical Society

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