{"title":"矿物中轻元素:碳和氮的电子探针微量分析","authors":"N. Nishida, M. Kimata","doi":"10.2465/GKK1952.26.203","DOIUrl":null,"url":null,"abstract":"Electron probe microanalysis (EPMA) of the wavelength-dispersive (WD) type offers some advantage in each quantitative analysis of carbon and nitrogen in non-conducting minerals coated with a thin film of Al-metal and carbon, respectively. The crystal of W/Si evaporated multilayers for long-wavelength WD spectrometry is used to cover the routine wavelength range for these elements. Both opening of the slit and accumulation of the intensity by reiterative measurements at several analytical points adjoining each other have improved the accuracy in the low count rates of 'soft' X-rays from canbon and nitrogen.","PeriodicalId":242743,"journal":{"name":"Journal of the Mineralogical Society of Japan","volume":"469 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Electron Probe Micro-Analysis of Minerals for Light Elements : Carbon and Nitrogen\",\"authors\":\"N. Nishida, M. Kimata\",\"doi\":\"10.2465/GKK1952.26.203\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electron probe microanalysis (EPMA) of the wavelength-dispersive (WD) type offers some advantage in each quantitative analysis of carbon and nitrogen in non-conducting minerals coated with a thin film of Al-metal and carbon, respectively. The crystal of W/Si evaporated multilayers for long-wavelength WD spectrometry is used to cover the routine wavelength range for these elements. Both opening of the slit and accumulation of the intensity by reiterative measurements at several analytical points adjoining each other have improved the accuracy in the low count rates of 'soft' X-rays from canbon and nitrogen.\",\"PeriodicalId\":242743,\"journal\":{\"name\":\"Journal of the Mineralogical Society of Japan\",\"volume\":\"469 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of the Mineralogical Society of Japan\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.2465/GKK1952.26.203\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of the Mineralogical Society of Japan","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2465/GKK1952.26.203","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electron Probe Micro-Analysis of Minerals for Light Elements : Carbon and Nitrogen
Electron probe microanalysis (EPMA) of the wavelength-dispersive (WD) type offers some advantage in each quantitative analysis of carbon and nitrogen in non-conducting minerals coated with a thin film of Al-metal and carbon, respectively. The crystal of W/Si evaporated multilayers for long-wavelength WD spectrometry is used to cover the routine wavelength range for these elements. Both opening of the slit and accumulation of the intensity by reiterative measurements at several analytical points adjoining each other have improved the accuracy in the low count rates of 'soft' X-rays from canbon and nitrogen.