{"title":"MANIFEST计量工具包","authors":"M. Goodwin, S. E. Hong","doi":"10.1117/12.2539897","DOIUrl":null,"url":null,"abstract":"The MANIFEST Metrology Toolkit for GMT is set of in-house software tools to assist in the concept development and demonstration of the MANIFEST Metrology System. The Metrology Toolkit forms part of the ongoing MANIFEST pre- Concept Design Study conducted throughout 2019. The Metrology System is an essential component to provide precise location measurements of Starbugs over the focal-plane and relay this information to the positioning system. The goal of the Metrology System is to provide a positional measurement better than 30 microns (0.03 arcsecs) over a field-plate diameter of 1.2 m. The Metrology Toolkit is intended to be flexible to verify different implementations of the Metrology System.","PeriodicalId":131350,"journal":{"name":"Micro + Nano Materials, Devices, and Applications","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-01-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"MANIFEST metrology toolkit\",\"authors\":\"M. Goodwin, S. E. Hong\",\"doi\":\"10.1117/12.2539897\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The MANIFEST Metrology Toolkit for GMT is set of in-house software tools to assist in the concept development and demonstration of the MANIFEST Metrology System. The Metrology Toolkit forms part of the ongoing MANIFEST pre- Concept Design Study conducted throughout 2019. The Metrology System is an essential component to provide precise location measurements of Starbugs over the focal-plane and relay this information to the positioning system. The goal of the Metrology System is to provide a positional measurement better than 30 microns (0.03 arcsecs) over a field-plate diameter of 1.2 m. The Metrology Toolkit is intended to be flexible to verify different implementations of the Metrology System.\",\"PeriodicalId\":131350,\"journal\":{\"name\":\"Micro + Nano Materials, Devices, and Applications\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-01-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Micro + Nano Materials, Devices, and Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2539897\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Micro + Nano Materials, Devices, and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2539897","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The MANIFEST Metrology Toolkit for GMT is set of in-house software tools to assist in the concept development and demonstration of the MANIFEST Metrology System. The Metrology Toolkit forms part of the ongoing MANIFEST pre- Concept Design Study conducted throughout 2019. The Metrology System is an essential component to provide precise location measurements of Starbugs over the focal-plane and relay this information to the positioning system. The goal of the Metrology System is to provide a positional measurement better than 30 microns (0.03 arcsecs) over a field-plate diameter of 1.2 m. The Metrology Toolkit is intended to be flexible to verify different implementations of the Metrology System.
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