{"title":"基于粗糙集的软件缺陷预测新方法","authors":"Weimin Yang, Longshu Li","doi":"10.1109/ICINIS.2008.132","DOIUrl":null,"url":null,"abstract":"High quality software should have as few defects as possible. Many modeling techniques have been proposed and applied for software quality prediction. Software projects vary in size and complexity, programming languages, development processes, etc. We research the correlation of software metrics focusing on the data sets of software defect prediction. A rough set model is presented to reduce the attributes of data sets of software defect prediction in this paper. Experiment shows its splendid performance.","PeriodicalId":185739,"journal":{"name":"2008 First International Conference on Intelligent Networks and Intelligent Systems","volume":"65 5 Pt B 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"A New Method to Predict Software Defect Based on Rough Sets\",\"authors\":\"Weimin Yang, Longshu Li\",\"doi\":\"10.1109/ICINIS.2008.132\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"High quality software should have as few defects as possible. Many modeling techniques have been proposed and applied for software quality prediction. Software projects vary in size and complexity, programming languages, development processes, etc. We research the correlation of software metrics focusing on the data sets of software defect prediction. A rough set model is presented to reduce the attributes of data sets of software defect prediction in this paper. Experiment shows its splendid performance.\",\"PeriodicalId\":185739,\"journal\":{\"name\":\"2008 First International Conference on Intelligent Networks and Intelligent Systems\",\"volume\":\"65 5 Pt B 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 First International Conference on Intelligent Networks and Intelligent Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICINIS.2008.132\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 First International Conference on Intelligent Networks and Intelligent Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICINIS.2008.132","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A New Method to Predict Software Defect Based on Rough Sets
High quality software should have as few defects as possible. Many modeling techniques have been proposed and applied for software quality prediction. Software projects vary in size and complexity, programming languages, development processes, etc. We research the correlation of software metrics focusing on the data sets of software defect prediction. A rough set model is presented to reduce the attributes of data sets of software defect prediction in this paper. Experiment shows its splendid performance.