{"title":"毫米波场效应管的噪声和小信号分布模型","authors":"L. Escotte, J. Mollier, M. Lecreff","doi":"10.1109/MWSYM.1988.22181","DOIUrl":null,"url":null,"abstract":"A distributed FET model is presented for millimeter-wave frequencies and experimental S-parameters are compared with distributed and lumped model values. Termed the sliced model, this distributed circuit model predicts S-parameters and four noise parameters up to frequency of 40 GHz from microwave noise figure measurements. An example is given that shows good agreement between theoretical data and S-parameters and noise figure measurements up to 26 GHz.<<ETX>>","PeriodicalId":339513,"journal":{"name":"1988., IEEE MTT-S International Microwave Symposium Digest","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Noise and small-signal distributed model of millimeter-wave FETs\",\"authors\":\"L. Escotte, J. Mollier, M. Lecreff\",\"doi\":\"10.1109/MWSYM.1988.22181\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A distributed FET model is presented for millimeter-wave frequencies and experimental S-parameters are compared with distributed and lumped model values. Termed the sliced model, this distributed circuit model predicts S-parameters and four noise parameters up to frequency of 40 GHz from microwave noise figure measurements. An example is given that shows good agreement between theoretical data and S-parameters and noise figure measurements up to 26 GHz.<<ETX>>\",\"PeriodicalId\":339513,\"journal\":{\"name\":\"1988., IEEE MTT-S International Microwave Symposium Digest\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-05-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1988., IEEE MTT-S International Microwave Symposium Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1988.22181\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988., IEEE MTT-S International Microwave Symposium Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1988.22181","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Noise and small-signal distributed model of millimeter-wave FETs
A distributed FET model is presented for millimeter-wave frequencies and experimental S-parameters are compared with distributed and lumped model values. Termed the sliced model, this distributed circuit model predicts S-parameters and four noise parameters up to frequency of 40 GHz from microwave noise figure measurements. An example is given that shows good agreement between theoretical data and S-parameters and noise figure measurements up to 26 GHz.<>