辐射对低压存储器影响的研究

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) Pub Date : 1997-09-15 DOI:10.1109/RADECS.1997.699001

B. Doucin, C. Poivey, C. Carlotti, A. Salminen, K. Ojasalo, R. Ahonen, P. Poirot, L. Baudry, R. Harboe Sorensen

{"title":"辐射对低压存储器影响的研究","authors":"B. Doucin, C. Poivey, C. Carlotti, A. Salminen, K. Ojasalo, R. Ahonen, P. Poirot, L. Baudry, R. Harboe Sorensen","doi":"10.1109/RADECS.1997.699001","DOIUrl":null,"url":null,"abstract":"Total Dose, heavy ion and proton irradiation were performed on 6 types of commercial memories (two 1 Mbit SRAMs, two 16 Mbit DRAMs, two 8 Mbit Flash memories), in order to evidence the effect of power supply on the results.","PeriodicalId":106774,"journal":{"name":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","volume":"193 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Study of radiation effects on low voltage memories\",\"authors\":\"B. Doucin, C. Poivey, C. Carlotti, A. Salminen, K. Ojasalo, R. Ahonen, P. Poirot, L. Baudry, R. Harboe Sorensen\",\"doi\":\"10.1109/RADECS.1997.699001\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Total Dose, heavy ion and proton irradiation were performed on 6 types of commercial memories (two 1 Mbit SRAMs, two 16 Mbit DRAMs, two 8 Mbit Flash memories), in order to evidence the effect of power supply on the results.\",\"PeriodicalId\":106774,\"journal\":{\"name\":\"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)\",\"volume\":\"193 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-09-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RADECS.1997.699001\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS.1997.699001","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 9

摘要

对6种商用存储器(2台1mbit sram、2台16mbit dram、2台8mbit闪存)进行了总剂量、重离子和质子辐照，以证明电源对结果的影响。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Study of radiation effects on low voltage memories

Total Dose, heavy ion and proton irradiation were performed on 6 types of commercial memories (two 1 Mbit SRAMs, two 16 Mbit DRAMs, two 8 Mbit Flash memories), in order to evidence the effect of power supply on the results.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)

自引率

0.00%

发文量