电子设备可测试性综合论证研究

Proceedings of the IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing) Pub Date : 2012-05-23 DOI:10.1109/PHM.2012.6228792

Y. Yin, Shang Chaoxuan, Yanheng Ma, Li Gang

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摘要

电子设备可测试性论证的方法有:固有可测试性分析、实验论证和仿真论证。这些方法中的每一种都会产生设备可测试性水平的不同方面，但结果是孤立的，并且每种方法之间没有联系。为了克服这一弱点，本文将多个方面的可测试性结合起来，以获得全面客观的结果，增加信心。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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The research on electronic equipment's testability integrated demonstration

Methods of testability demonstration in electronic equipments are: inherent testability analysis, experimental demonstration and simulated demonstration. Each of these methods yield different aspects of the level of equipment's testability, but the result is isolated and there are no connections with each method. In order to overcome this weakness, this paper combines many aspects of testability to achieve a full-scale and objective result to increase confidence.

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Proceedings of the IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing)

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