CCD辐射噪声建模的新方法

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) Pub Date : 1997-09-15 DOI:10.1109/RADECS.1997.698953

A. Chugg, G. Hopkinson

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引用次数: 5

摘要

蒙特卡罗电子-光子辐射输运码所报告的能量沉积由于产生结果的粒子历史数量有限而受到随机误差的影响。这些通常令人讨厌的统计变化，也可以与CCD像素在持续辐射环境中所经历的实际辐射噪声效应相识别。本文通过将ITS套件中的ACCEPT代码应用于暴露于电子通量的屏蔽CCD的情况，探讨了这种辐射噪声建模的实用性。结果与随后用范德格拉夫加速器对CCD进行电子辐照得到的结果进行了比较。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A new approach to modelling radiation noise in CCD's

The energy depositions reported by Monte Carlo electron-photon radiation transport codes are subject to a random error due to the finite number of particle histories used to generate the results. These statistical variations, normally a nuisance, may also be identified with the real radiation noise effects experienced by CCD pixels in persistent radiation environments. This paper explores the practicability of such radiation noise modelling by applying the ACCEPT code from the ITS suite to the case of a shielded CCD exposed to an electron flux. The results are compared with those obtained in a subsequent electron irradiation of the CCD by a Van de Graaff accelerator.

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RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)

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