基于窄带半导体的多元件CID光电探测器工作的基本问题

2009 International School and Seminar on Modern Problems of Nanoelectronics, Micro- and Nanosystem Technologies Pub Date : 2009-11-13 DOI:10.1109/INTERNANO.2009.5335643

B. G. Vainer

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引用次数: 0

摘要

本文综述了作为电荷注入器件(CID)工作的基于窄带半导体的红外辐射多元(线性和矩阵)探测器的若干基本问题。讨论了CID元件的冗余横向光敏性、串扰、MIS结构的电场不稳定性、动态曝光条件下光电探测器的工作、探测器的光谱特性等问题。

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Fundamental problems of functioning the multielement CID photodetectors on the base of narrow-band semiconductors

A review of the number of fundamental problems connected with functioning the multielement (linear and matrix) detectors of infrared radiation based on narrow-band semiconductors which are operating as a charge injection devices (CID) is given in this paper. Such questions as redundant lateral photo-sensitivity of CID elements, cross-talks, electric field instability of MIS structures, operation of photodetectors under the conditions of dynamic exposure, the spectral characteristic of detectors, etc. are discussed.

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2009 International School and Seminar on Modern Problems of Nanoelectronics, Micro- and Nanosystem Technologies

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