基于k -CNOT可逆电路的SMGFs故障诊断技术

Mousum Handique, J. K. Deka, S. Biswas
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引用次数: 0

摘要

本文介绍了一种基于k -CNOT可逆逻辑电路的故障诊断技术,以获得单缺门故障的准确位置。所提出的故障诊断技术表明,所生成的单个测试向量能够准确地识别出smgf的位置。为此,我们构建了具有CUT (Test circuit Under Test)特性的增强电路,可测试增强电路用于检测SMGF故障。奇偶校验操作包含在构造的增广$k$-CNOT电路中,以获得SMGF的确切位置。最后,本文给出了实验结果和分析,以证明该方法在k -CNOT电路中准确定位故障的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Fault Diagnosis Technique of SMGFs in $k$-CNOT Based Reversible Circuits
This paper introduces a fault diagnosis technique to obtain the exact location of Single Missing Gate Faults (SMGFs) in $k$-CNOT based reversible logic circuits. The proposed fault diagnosis technique establishes that the generated single test vector can identify the exact location of SMGFs. For this purpose, we construct the augmented circuit that behaves as Circuit Under Test (CUT) and the testable augmented circuit is used for detecting the SMGF faults. The parity checking operations are included in the constructed augmented $k$-CNOT circuit to obtain the exact location of SMGF. Finally, this paper presents the experimental results and analysis in order to show the effectiveness of determining the exact location of faults in a $k$-CNOT circuit.
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