{"title":"金砖四国——新一代PXI开关产品【ATE系统应用】","authors":"K. Moore, D. Owen","doi":"10.1109/AUTEST.2003.1243616","DOIUrl":null,"url":null,"abstract":"Switching systems are an important part of any ATE system, and PXI has proven to be an ideal format to host them. Concerns about the complexity of switching that can be supported in PXI have proven to be unfounded, as the new generation of BRIC switches from Pickering Interfaces has shown. This presentation shows how Pickering Interfaces have achieved switching densities not previously seen in a modular test format before, significantly exceeding the capability of VXI systems. The BRIC design uses a modular architecture within the PXI format that allows Pickering Interfaces to offer the user a large variety of matrix sizes while maintaining a high switching bandwidth and fast operating times. The architecture permits the user to upgrade the matrix size by the use of expansion cards. The presentation examines how the BRIC matrix is designed and how it can be most effectively used in applications requiring connection to high pin count test targets. The availability of complex high density switching systems in PXI allows many test scenarios to be supported that were previously the domain of more expensive and larger test systems.","PeriodicalId":385780,"journal":{"name":"Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference.","volume":"105 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"The BRIC - a new generation of PXI switch products [ATE system applications]\",\"authors\":\"K. Moore, D. Owen\",\"doi\":\"10.1109/AUTEST.2003.1243616\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Switching systems are an important part of any ATE system, and PXI has proven to be an ideal format to host them. Concerns about the complexity of switching that can be supported in PXI have proven to be unfounded, as the new generation of BRIC switches from Pickering Interfaces has shown. This presentation shows how Pickering Interfaces have achieved switching densities not previously seen in a modular test format before, significantly exceeding the capability of VXI systems. The BRIC design uses a modular architecture within the PXI format that allows Pickering Interfaces to offer the user a large variety of matrix sizes while maintaining a high switching bandwidth and fast operating times. The architecture permits the user to upgrade the matrix size by the use of expansion cards. The presentation examines how the BRIC matrix is designed and how it can be most effectively used in applications requiring connection to high pin count test targets. The availability of complex high density switching systems in PXI allows many test scenarios to be supported that were previously the domain of more expensive and larger test systems.\",\"PeriodicalId\":385780,\"journal\":{\"name\":\"Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference.\",\"volume\":\"105 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-11-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2003.1243616\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2003.1243616","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The BRIC - a new generation of PXI switch products [ATE system applications]
Switching systems are an important part of any ATE system, and PXI has proven to be an ideal format to host them. Concerns about the complexity of switching that can be supported in PXI have proven to be unfounded, as the new generation of BRIC switches from Pickering Interfaces has shown. This presentation shows how Pickering Interfaces have achieved switching densities not previously seen in a modular test format before, significantly exceeding the capability of VXI systems. The BRIC design uses a modular architecture within the PXI format that allows Pickering Interfaces to offer the user a large variety of matrix sizes while maintaining a high switching bandwidth and fast operating times. The architecture permits the user to upgrade the matrix size by the use of expansion cards. The presentation examines how the BRIC matrix is designed and how it can be most effectively used in applications requiring connection to high pin count test targets. The availability of complex high density switching systems in PXI allows many test scenarios to be supported that were previously the domain of more expensive and larger test systems.