{"title":"基于现场可编程门阵列的空间计算机体系结构可靠性分析","authors":"J. Hogan, R. Weber, B. Lameres","doi":"10.2514/1.I010481","DOIUrl":null,"url":null,"abstract":"This paper presents an analysis of the radiation tolerance of field-programmable gate-array-based space computers. The primary failure mechanism studied in this paper is single-event effects due to...","PeriodicalId":179117,"journal":{"name":"J. Aerosp. Inf. Syst.","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Reliability Analysis of Field-Programmable Gate-Array-Based Space Computer Architectures\",\"authors\":\"J. Hogan, R. Weber, B. Lameres\",\"doi\":\"10.2514/1.I010481\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an analysis of the radiation tolerance of field-programmable gate-array-based space computers. The primary failure mechanism studied in this paper is single-event effects due to...\",\"PeriodicalId\":179117,\"journal\":{\"name\":\"J. Aerosp. Inf. Syst.\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-04-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"J. Aerosp. Inf. Syst.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.2514/1.I010481\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"J. Aerosp. Inf. Syst.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2514/1.I010481","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliability Analysis of Field-Programmable Gate-Array-Based Space Computer Architectures
This paper presents an analysis of the radiation tolerance of field-programmable gate-array-based space computers. The primary failure mechanism studied in this paper is single-event effects due to...