{"title":"传感器阵列故障传感器的鲁棒自主检测","authors":"Siddhartha Ghosh, A. Freitas, I. Marshall","doi":"10.1109/CAMSAP.2007.4498008","DOIUrl":null,"url":null,"abstract":"We propose a technique for the autonomous detection of the faulty sensors of a sensor array that are aberrant relative to the rest. Our approach is based on probabilistically modeling the distribution of the differences between the sensor measurements as a mixture of Gaussians and then classifying further instances of the sensor differences using a naive Bayes classifier. We demonstrate the applicability of this technique to the diagnosis of the sensors/photosites of a CCD array, using sensor array data comprising of randomly selected images. Our technique performs well for different combinations of parameter settings at the detection of the faulty photosites of a CCD array.","PeriodicalId":220687,"journal":{"name":"2007 2nd IEEE International Workshop on Computational Advances in Multi-Sensor Adaptive Processing","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Robust Autonomous Detection of the Faulty Sensors of a Sensor Array\",\"authors\":\"Siddhartha Ghosh, A. Freitas, I. Marshall\",\"doi\":\"10.1109/CAMSAP.2007.4498008\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose a technique for the autonomous detection of the faulty sensors of a sensor array that are aberrant relative to the rest. Our approach is based on probabilistically modeling the distribution of the differences between the sensor measurements as a mixture of Gaussians and then classifying further instances of the sensor differences using a naive Bayes classifier. We demonstrate the applicability of this technique to the diagnosis of the sensors/photosites of a CCD array, using sensor array data comprising of randomly selected images. Our technique performs well for different combinations of parameter settings at the detection of the faulty photosites of a CCD array.\",\"PeriodicalId\":220687,\"journal\":{\"name\":\"2007 2nd IEEE International Workshop on Computational Advances in Multi-Sensor Adaptive Processing\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 2nd IEEE International Workshop on Computational Advances in Multi-Sensor Adaptive Processing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CAMSAP.2007.4498008\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 2nd IEEE International Workshop on Computational Advances in Multi-Sensor Adaptive Processing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CAMSAP.2007.4498008","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Robust Autonomous Detection of the Faulty Sensors of a Sensor Array
We propose a technique for the autonomous detection of the faulty sensors of a sensor array that are aberrant relative to the rest. Our approach is based on probabilistically modeling the distribution of the differences between the sensor measurements as a mixture of Gaussians and then classifying further instances of the sensor differences using a naive Bayes classifier. We demonstrate the applicability of this technique to the diagnosis of the sensors/photosites of a CCD array, using sensor array data comprising of randomly selected images. Our technique performs well for different combinations of parameter settings at the detection of the faulty photosites of a CCD array.