{"title":"我们到了吗?","authors":"D. Mazyck","doi":"10.1177/1942602x08322135","DOIUrl":null,"url":null,"abstract":"How do you know when you have run enough random tests? A constraint-driven random environment requires comprehensive coverage data, which often leads to information overload. Without an automatic way to associate pieces of coverage data with a particular feature-set in the test plan, the coverage report is only meaningful to the creator of the data. This paper discusses the evaluation of Synopsys’ VMM Planner, which we are using to manage the verification process for our suite of BIST macros. Even with an evolving set of goals, it is helping us to answer the question: Are We There Yet?","PeriodicalId":412278,"journal":{"name":"NASN Newsletter","volume":"140 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Are We There Yet?\",\"authors\":\"D. Mazyck\",\"doi\":\"10.1177/1942602x08322135\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"How do you know when you have run enough random tests? A constraint-driven random environment requires comprehensive coverage data, which often leads to information overload. Without an automatic way to associate pieces of coverage data with a particular feature-set in the test plan, the coverage report is only meaningful to the creator of the data. This paper discusses the evaluation of Synopsys’ VMM Planner, which we are using to manage the verification process for our suite of BIST macros. Even with an evolving set of goals, it is helping us to answer the question: Are We There Yet?\",\"PeriodicalId\":412278,\"journal\":{\"name\":\"NASN Newsletter\",\"volume\":\"140 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"NASN Newsletter\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1177/1942602x08322135\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"NASN Newsletter","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1177/1942602x08322135","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
How do you know when you have run enough random tests? A constraint-driven random environment requires comprehensive coverage data, which often leads to information overload. Without an automatic way to associate pieces of coverage data with a particular feature-set in the test plan, the coverage report is only meaningful to the creator of the data. This paper discusses the evaluation of Synopsys’ VMM Planner, which we are using to manage the verification process for our suite of BIST macros. Even with an evolving set of goals, it is helping us to answer the question: Are We There Yet?
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