G. Pedrini, A. Faridian, P. Gao, D. Naik, A. Singh, W. Osten, M. Takeda
{"title":"光学成像和计量的相位检索方法","authors":"G. Pedrini, A. Faridian, P. Gao, D. Naik, A. Singh, W. Osten, M. Takeda","doi":"10.1109/WIO.2014.6933285","DOIUrl":null,"url":null,"abstract":"Phase retrieval methods have useful applications for optical imaging and metrology. We will see how holographic techniques may be used for increasing the resolution of microscopic images, measurement of residual stresses, imaging of occluded objects, imaging using incoherent illumination; furthermore, phase retrieval methods, which do not use a reference wave, are described.","PeriodicalId":183646,"journal":{"name":"2014 13th Workshop on Information Optics (WIO)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Phase retrieval methods for optical imaging and metrology\",\"authors\":\"G. Pedrini, A. Faridian, P. Gao, D. Naik, A. Singh, W. Osten, M. Takeda\",\"doi\":\"10.1109/WIO.2014.6933285\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Phase retrieval methods have useful applications for optical imaging and metrology. We will see how holographic techniques may be used for increasing the resolution of microscopic images, measurement of residual stresses, imaging of occluded objects, imaging using incoherent illumination; furthermore, phase retrieval methods, which do not use a reference wave, are described.\",\"PeriodicalId\":183646,\"journal\":{\"name\":\"2014 13th Workshop on Information Optics (WIO)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-07-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 13th Workshop on Information Optics (WIO)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WIO.2014.6933285\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 13th Workshop on Information Optics (WIO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WIO.2014.6933285","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Phase retrieval methods for optical imaging and metrology
Phase retrieval methods have useful applications for optical imaging and metrology. We will see how holographic techniques may be used for increasing the resolution of microscopic images, measurement of residual stresses, imaging of occluded objects, imaging using incoherent illumination; furthermore, phase retrieval methods, which do not use a reference wave, are described.