{"title":"细幅光栅产生的光场测量","authors":"Myun-Sik Kim, T. Scharf, H. Herzig","doi":"10.1109/OMEMS.2010.5672135","DOIUrl":null,"url":null,"abstract":"High resolution amplitude and phase of light fields emerging from a 2-μm-period amplitude grating are measured for different wavelengths. The amplitude gratings lead to highly periodic patterns caused by the Talbot effect. Such patterns reach periodicities of a fraction of the grating period. We discuss the effect of wavelengths and the number of diffraction orders participating in the imaging.","PeriodicalId":421895,"journal":{"name":"2010 International Conference on Optical MEMS and Nanophotonics","volume":"1100 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Measurements of light fields emerging from fine amplitude gratings\",\"authors\":\"Myun-Sik Kim, T. Scharf, H. Herzig\",\"doi\":\"10.1109/OMEMS.2010.5672135\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"High resolution amplitude and phase of light fields emerging from a 2-μm-period amplitude grating are measured for different wavelengths. The amplitude gratings lead to highly periodic patterns caused by the Talbot effect. Such patterns reach periodicities of a fraction of the grating period. We discuss the effect of wavelengths and the number of diffraction orders participating in the imaging.\",\"PeriodicalId\":421895,\"journal\":{\"name\":\"2010 International Conference on Optical MEMS and Nanophotonics\",\"volume\":\"1100 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-12-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 International Conference on Optical MEMS and Nanophotonics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/OMEMS.2010.5672135\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International Conference on Optical MEMS and Nanophotonics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OMEMS.2010.5672135","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurements of light fields emerging from fine amplitude gratings
High resolution amplitude and phase of light fields emerging from a 2-μm-period amplitude grating are measured for different wavelengths. The amplitude gratings lead to highly periodic patterns caused by the Talbot effect. Such patterns reach periodicities of a fraction of the grating period. We discuss the effect of wavelengths and the number of diffraction orders participating in the imaging.
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