Y. Oodate, Y. Tanimoto, H. Tanoue, H. Kikuchihara, H. Miyamoto, H. Mattausch, M. Miura-Mattausch
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Compact modeling of carrier trapping for accurate prediction of frequency dependent circuit operation
We have investigated the influence of carrier traps on device characteristics in TFTs. In particular, our focus was given on transient characteristics influenced by carrier trapping during device operations. A compact model for circuit simulation of TFTs has been developed by considering the time constant of the trapping. The model was verified with measured frequency dependent TFT characteristics.