{"title":"一个集成电路开发跟踪和统计检索系统","authors":"T. Cardoso, J. Nacif, A. O. Fernandes, C. Coelho","doi":"10.1109/LATW.2009.4813810","DOIUrl":null,"url":null,"abstract":"Verification is one of the most critical stages in integrated circuit development. Given the current market conditions, a wise manner to improve verification results would be concentrating resources in error-prone modules. In this paper a novel method of attaching information to commit messages is introduced. Through the use of a simple and parseable language, important and more accurate statistics can be retrieved. Tools were developed in order to make commits faster and prevent erroneous data analysis.","PeriodicalId":343240,"journal":{"name":"2009 10th Latin American Test Workshop","volume":"1072 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-03-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"BugTracer: A system for integrated circuit development tracking and statistics retrieval\",\"authors\":\"T. Cardoso, J. Nacif, A. O. Fernandes, C. Coelho\",\"doi\":\"10.1109/LATW.2009.4813810\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Verification is one of the most critical stages in integrated circuit development. Given the current market conditions, a wise manner to improve verification results would be concentrating resources in error-prone modules. In this paper a novel method of attaching information to commit messages is introduced. Through the use of a simple and parseable language, important and more accurate statistics can be retrieved. Tools were developed in order to make commits faster and prevent erroneous data analysis.\",\"PeriodicalId\":343240,\"journal\":{\"name\":\"2009 10th Latin American Test Workshop\",\"volume\":\"1072 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-03-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 10th Latin American Test Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LATW.2009.4813810\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 10th Latin American Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATW.2009.4813810","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
BugTracer: A system for integrated circuit development tracking and statistics retrieval
Verification is one of the most critical stages in integrated circuit development. Given the current market conditions, a wise manner to improve verification results would be concentrating resources in error-prone modules. In this paper a novel method of attaching information to commit messages is introduced. Through the use of a simple and parseable language, important and more accurate statistics can be retrieved. Tools were developed in order to make commits faster and prevent erroneous data analysis.
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